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Nuclear magnetic resonance spectra (NMR) measurements with 500 MHz Bruker Avance III spectrometer for 1H, 13C, 19F or 31P nuclei. Possibility to measure solid state samples. Prices from 89 €/sample.
Imaging with FEI Tecnai 12 120kV TEM or JEOL JEM-2800 High-Resolution TEM. Prices from 109 €/sample.
Imaging with Zeiss Sigma VP or EDS with JEOL JSM-7500FA SEM. Prices from 69 €/sample.
Differential scanning calorimetry to determine eg. glass transition temperature (Tg) of the sample. https://en.wikipedia.org/wiki/Differential_scanning_calorimetry
Elastic Recoil Detection Analysis (ERDA), also referred to as forward recoil scattering. Used to obtain elemental concentration depth profiles in thin films. https://en.wikipedia.org/wiki/Elastic_recoil_detection
Fourier-transform infrared spectrometer for identification of materials and functional groups in chemical samples. https://en.wikipedia.org/wiki/Fourier-transform_infrared_spectroscopy
Gas chromatography-mass spectrometry for qualitative and quantitative analysis of volatile compounds. https://en.wikipedia.org/wiki/Gas_chromatography%E2%80%93mass_spectrometry
Ion chromatography (IC) for determination of cations and anions. https://en.wikipedia.org/wiki/Ion_chromatography
Inductively coupled plasma mass spectrometry (ICP-MS) for determination of metals and selected non-metals down to ppb level. https://en.wikipedia.org/wiki/Inductively_coupled_plasma_mass_spectrometry
Inductively coupled plasma mass spectrometry (ICP-OES) for determination of metals. https://en.wikipedia.org/wiki/Inductively_coupled_plasma_atomic_emission_spectroscopy
Microwave plasma-atomic emission spectroscopy (MP-AES) spectrometer for determination of metal concentrations.
Particle-induced gamma emission (PIGE) is a form of nuclear reaction analysis, used for determination of light elements (e.g. Na, Al and Si) in solid samples. https://en.wikipedia.org/wiki/Particle-induced_gamma_emission
Polarized optical microscope. Can be used without polarizers as light microscope. https://en.wikipedia.org/wiki/Polarized_light_microscopy
Rutherford backscattering spectrometry, also called high-energy ion scattering (HEIS) spectrometry. RBS is used to determine the structure and composition of materials by measuring the backscattering of a beam of high energy ions. https://en.wikipedia.org/wiki/Rutherford_backscattering_spectrometry
Thermogravimetric analysis to determine at what temperature the sample degrades. https://en.wikipedia.org/wiki/Thermogravimetric_analysis
X-ray powder diffraction for identification of a crystalline materials. https://en.wikipedia.org/wiki/X-ray_crystallography
A fixed-angle DLS to determine particle sizes in a solvent. https://en.wikipedia.org/wiki/Dynamic_light_scattering
Laser diffraction particle size analyzer for determination of particle size distributions for both dry samples and wet dispersions.